Verification of ESD safety on full chip level is a major challenge for IC design. Especially phenomena with their origin in the overall product setup are posing a hurdle on the way to ESD safe products. For stress according to the Charged Device Model (CDM). a stumbling stone for a simulation based analysis is the complex current distribution among a huge number of internal nodes lead... https://www.nacrack.com/mega-choice-2005-2006-NISSAN-ALTIMA-Radio-Receiver-AM-FM-stereo-single-CD-Player-G-mega-value/